Gas electron diffraction study of the molecular structure of diphenyl sulphone and diphenyl sulphoxide

Béla Rozsondai, Jack H. Moore, Donald C. Gregory, István Hargittai

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The analysis of gas electron diffraction data yielded the bond lengths (rg) of diphenyl sulphone, (C6H5)2SO2: CC 1.400(3) Å, CH 1.100(11) Å, SC 1.772(5) Å and SO 1.440(5) Å, and of diphenyl sulphoxide, (C6H5)2 SO: CC 1.398(3) Å, CH 1.105(11) Å, SC 1.804(6) Å and SO 1.489(5) Å. Limited information on the bond angles and conformation was obtained. The data on the stretching frequencies and lengths of SO bonds for sulphoxides are consistent with the relationship established for sulphones between [0.5 (ν2s + ν2as)]0.5 and r(SO).

Original languageEnglish
Pages (from-to)69-76
Number of pages8
JournalJournal of Molecular Structure
Volume51
Issue numberC
DOIs
Publication statusPublished - 1979

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy
  • Organic Chemistry
  • Inorganic Chemistry

Fingerprint Dive into the research topics of 'Gas electron diffraction study of the molecular structure of diphenyl sulphone and diphenyl sulphoxide'. Together they form a unique fingerprint.

  • Cite this