Gas-deposited WO3 nanoparticles studied by scanning force microscopy

J. Kopniczky, A. Hoel, A. Mechler, P. Heszler, C. G. Granqvist

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

WO3 nanoparticles were generated by gas deposition. Deposits on Al substrates were studied by scanning force microscopy operated in the intermittent-contact (tapping) mode. At low surface coverage (<0.5 %), we observed single nanoparticles with a mean size of ∼ 1.5 nm. An increase of the amount of particles led to agglomerates, which appeared at surface coverages as low as 2 to 4 %. At full coverage the mean agglomerate size was ∼ 5 nm. This value did not change as the sample was annealed at temperatures up to 250°C. The size distribution of the agglomerates was found to be log-normal, i.e., similar to the size distribution of the gas-phase nanoparticles forming the deposit. For explaining the obtained log-normal size distribution of the agglomerates simulations of the agglomeration process were also carried out.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.M. Smulko, Y. Blanter, M.I. Dykman, L.B. Kish
Pages183-190
Number of pages8
Volume5472
DOIs
Publication statusPublished - 2004
EventNoise and Information in Nanoelectronics, Sensors, and Standards II - Maspalomas
Duration: May 26 2004May 28 2004

Other

OtherNoise and Information in Nanoelectronics, Sensors, and Standards II
CityMaspalomas
Period5/26/045/28/04

Fingerprint

Atomic force microscopy
Nanoparticles
microscopy
nanoparticles
scanning
Deposits
deposits
Gases
gases
agglomeration
Agglomeration
vapor phases
Substrates
simulation
Temperature
temperature

Keywords

  • Agglomeration
  • Nanoparticle
  • Scanning force microscopy
  • Sensor
  • Size-distribution
  • WO

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Kopniczky, J., Hoel, A., Mechler, A., Heszler, P., & Granqvist, C. G. (2004). Gas-deposited WO3 nanoparticles studied by scanning force microscopy. In J. M. Smulko, Y. Blanter, M. I. Dykman, & L. B. Kish (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5472, pp. 183-190) https://doi.org/10.1117/12.547356

Gas-deposited WO3 nanoparticles studied by scanning force microscopy. / Kopniczky, J.; Hoel, A.; Mechler, A.; Heszler, P.; Granqvist, C. G.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.M. Smulko; Y. Blanter; M.I. Dykman; L.B. Kish. Vol. 5472 2004. p. 183-190.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kopniczky, J, Hoel, A, Mechler, A, Heszler, P & Granqvist, CG 2004, Gas-deposited WO3 nanoparticles studied by scanning force microscopy. in JM Smulko, Y Blanter, MI Dykman & LB Kish (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5472, pp. 183-190, Noise and Information in Nanoelectronics, Sensors, and Standards II, Maspalomas, 5/26/04. https://doi.org/10.1117/12.547356
Kopniczky J, Hoel A, Mechler A, Heszler P, Granqvist CG. Gas-deposited WO3 nanoparticles studied by scanning force microscopy. In Smulko JM, Blanter Y, Dykman MI, Kish LB, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5472. 2004. p. 183-190 https://doi.org/10.1117/12.547356
Kopniczky, J. ; Hoel, A. ; Mechler, A. ; Heszler, P. ; Granqvist, C. G. / Gas-deposited WO3 nanoparticles studied by scanning force microscopy. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.M. Smulko ; Y. Blanter ; M.I. Dykman ; L.B. Kish. Vol. 5472 2004. pp. 183-190
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