Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing

Ákos Nemcsics, Szilvia Nagy, Imre Mojzes, Péter Turmezei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.

Original languageEnglish
Title of host publicationSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics
Pages65-67
Number of pages3
DOIs
Publication statusPublished - Dec 1 2009
EventSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics - Subotica, Serbia
Duration: Sep 25 2009Sep 26 2009

Publication series

NameSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics

Other

OtherSISY 2009 - 7th International Symposium on Intelligent Systems and Informatics
CountrySerbia
CitySubotica
Period9/25/099/26/09

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ASJC Scopus subject areas

  • Artificial Intelligence
  • Information Systems

Cite this

Nemcsics, Á., Nagy, S., Mojzes, I., & Turmezei, P. (2009). Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing. In SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics (pp. 65-67). [5291194] (SISY 2009 - 7th International Symposium on Intelligent Systems and Informatics). https://doi.org/10.1109/SISY.2009.5291194