Measurements were made of the dependence of melting point and crystallization temperature on particle size, using vacuum- deposited indium films in situ with electron microscopy. A preferred orientation was found to develop at a given crystallite size depending on the substrate temperature and on the ratio of impinging oxygen molecules to film atoms.
|Number of pages||4|
|Journal||J Vac Sci Technol|
|Publication status||Published - Jan 1 1969|
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