Abstract
Epitaxial 3C-SiC grains are formed at 1190 °C in the top region of silicon, when Si wafers coated by SiO2 are annealed in CO atmosphere. The formed SiC grains are 40-50 nm high and 100 nm wide in cross-section and contain only few defects. Main advantage of the method is that the final structure is free of voids. The above method is further developed for the generation of SiC nanocrystals, embedded in SiO2 on Si, and aligned parallel with the interface. The nanometer-sized SiC grains were grown into SiO2 close to the Si/SiO2 interface by a two-step annealing of oxide covered Si: first in a CO, than in a pure O2 atmosphere. The first (carbonization) step created epitaxial SiC crystallites grown into the Si surface, while the second (oxidation) step moved the interface beyond them. Conventional and high resolution cross-sectional electron microscopy showed pyramidal Si protrusions at the Si/SiO2 interface under the grains. The size of the grains, as well as their distance from the Si/SiO2 interface (peak of pyramids) can be controlled by the annealing process parameters. The process can be repeated and SiC nanocrystals (oriented in the same way) can be produced in a multilevel structure.
| Original language | English |
|---|---|
| Pages (from-to) | 2671-2674 |
| Number of pages | 4 |
| Journal | Surface Science |
| Volume | 601 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - Jul 1 2007 |
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Keywords
- Electron microscopy
- Epitaxy
- SiC
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
Cite this
Formation of epitaxial SiC nanocrystals. / Pécz, B.; Makkai, Zs; Pongrácz, A.; Bársony, I.; Deák, P.; Josepovits, K.
In: Surface Science, Vol. 601, No. 13, 01.07.2007, p. 2671-2674.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Formation of epitaxial SiC nanocrystals
AU - Pécz, B.
AU - Makkai, Zs
AU - Pongrácz, A.
AU - Bársony, I.
AU - Deák, P.
AU - Josepovits, K.
PY - 2007/7/1
Y1 - 2007/7/1
N2 - Epitaxial 3C-SiC grains are formed at 1190 °C in the top region of silicon, when Si wafers coated by SiO2 are annealed in CO atmosphere. The formed SiC grains are 40-50 nm high and 100 nm wide in cross-section and contain only few defects. Main advantage of the method is that the final structure is free of voids. The above method is further developed for the generation of SiC nanocrystals, embedded in SiO2 on Si, and aligned parallel with the interface. The nanometer-sized SiC grains were grown into SiO2 close to the Si/SiO2 interface by a two-step annealing of oxide covered Si: first in a CO, than in a pure O2 atmosphere. The first (carbonization) step created epitaxial SiC crystallites grown into the Si surface, while the second (oxidation) step moved the interface beyond them. Conventional and high resolution cross-sectional electron microscopy showed pyramidal Si protrusions at the Si/SiO2 interface under the grains. The size of the grains, as well as their distance from the Si/SiO2 interface (peak of pyramids) can be controlled by the annealing process parameters. The process can be repeated and SiC nanocrystals (oriented in the same way) can be produced in a multilevel structure.
AB - Epitaxial 3C-SiC grains are formed at 1190 °C in the top region of silicon, when Si wafers coated by SiO2 are annealed in CO atmosphere. The formed SiC grains are 40-50 nm high and 100 nm wide in cross-section and contain only few defects. Main advantage of the method is that the final structure is free of voids. The above method is further developed for the generation of SiC nanocrystals, embedded in SiO2 on Si, and aligned parallel with the interface. The nanometer-sized SiC grains were grown into SiO2 close to the Si/SiO2 interface by a two-step annealing of oxide covered Si: first in a CO, than in a pure O2 atmosphere. The first (carbonization) step created epitaxial SiC crystallites grown into the Si surface, while the second (oxidation) step moved the interface beyond them. Conventional and high resolution cross-sectional electron microscopy showed pyramidal Si protrusions at the Si/SiO2 interface under the grains. The size of the grains, as well as their distance from the Si/SiO2 interface (peak of pyramids) can be controlled by the annealing process parameters. The process can be repeated and SiC nanocrystals (oriented in the same way) can be produced in a multilevel structure.
KW - Electron microscopy
KW - Epitaxy
KW - SiC
UR - http://www.scopus.com/inward/record.url?scp=34250744234&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34250744234&partnerID=8YFLogxK
U2 - 10.1016/j.susc.2006.12.014
DO - 10.1016/j.susc.2006.12.014
M3 - Article
AN - SCOPUS:34250744234
VL - 601
SP - 2671
EP - 2674
JO - Surface Science
JF - Surface Science
SN - 0039-6028
IS - 13
ER -