Formation and structure of alkyl-phosphonic acid layers on passive iron

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Phosphonate layer formation on passive iron surface has been investigated by electrochemical and atomic force microscopy techniques. It was found that phosphonate groups bond more strongly to oxide surface, while metallic iron surface is disadvantageous for phosphonate layer formation in aqueous solutions. The rate of anodic dissolution is continually decreasing due to the time-dependent formation of protective phosphonate layer. The kinetics of phosphonate layer formation on passive iron is determined by the potential applied for preceding passive film formation. The size and shape of iron oxide grains depends slightly on the potential of passivation. Changes in morphology due to the phosphonate layer formation have been recorded by AFM.

Original languageEnglish
Title of host publicationMaterials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics
Pages239-246
Number of pages8
Publication statusPublished - Dec 1 2007
Event5th Hungarian Conference on Materials Science, Testing and lnformatics - Balatonfured, Hungary
Duration: Oct 9 2005Oct 11 2005

Publication series

NameMaterials Science Forum
Volume537-538
ISSN (Print)0255-5476

Other

Other5th Hungarian Conference on Materials Science, Testing and lnformatics
CountryHungary
CityBalatonfured
Period10/9/0510/11/05

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Keywords

  • Corrosion protection
  • Passive iron
  • Phosphonic acid
  • Surface modification
  • Thin layers

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Paszternák, A., Felhosi, I., Keresztes, Z., & Kálmán, E. (2007). Formation and structure of alkyl-phosphonic acid layers on passive iron. In Materials Science, Testing and Informatics III - Proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics (pp. 239-246). (Materials Science Forum; Vol. 537-538).