Formation and decay of hydrated electron in photoredox chemistry of metal complexes

O. Horváth, Attila Horvara, Kenneth L. Stevenson

Research output: Contribution to journalArticle

Abstract

Prompt and delayed photoejections of electron occur upon irradiation (λir = 266 nm) of kinetically labile halocuprate(I) and triamminecopper(I) complexes in aqueous solutions. In all systems, the primary, singlet excited species promptly eject electrons. The source of delayed electrons in the case of the halo complexes are the luminescent, triplet excited-state bis and tris coordinated species, which are formed via intersystem crossing from the singlet states and exist in equilibrium. In the ammonia system, however, formation of excited-state dinuclear complexes (*Cu2(NH3)3+n2+ = 2, 3) play an important role in the delayed ejection of electron. Hydrated electrons formed in these systems are scavenged by the ground-state complexes themselves. Efficiency of this reaction is considerably affected by the charge of the scavengers. In the case of kinetically stable complexes, application of micelles with negative or positive surface charge can also influence this scavenging. The micellar effects can be demonstrated in the photoredox chemistry ofFe(bpv)2(CN)2.

Original languageEnglish
Pages (from-to)811-820
Number of pages10
JournalACH - Models in Chemistry
Volume135
Issue number5
Publication statusPublished - 1998

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Coordination Complexes
Electrons
Excited states
Scavenging
Micelles
Surface charge
Ammonia
Ground state
Irradiation

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Formation and decay of hydrated electron in photoredox chemistry of metal complexes. / Horváth, O.; Horvara, Attila; Stevenson, Kenneth L.

In: ACH - Models in Chemistry, Vol. 135, No. 5, 1998, p. 811-820.

Research output: Contribution to journalArticle

Horváth, O. ; Horvara, Attila ; Stevenson, Kenneth L. / Formation and decay of hydrated electron in photoredox chemistry of metal complexes. In: ACH - Models in Chemistry. 1998 ; Vol. 135, No. 5. pp. 811-820.
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