Few-femtosecond plasmon transients probed with nm-scale sensitivity

Bela Lovasz, Peter Sandor, Zsuzsanna Papa, Balint Eles, Balazs Banhegyi, Peter Racz, Christine Prietl, Joachim R. Krenn, Peter Dombi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Full spatiotemporal reconstruction of the evolution of plasmonic fields is a major goal in plasmonics in order to investigate the buildup and decay of collective electron phenomena. Here, we demonstrate few-femtosecond probing of plasmon transients uniquely combined with nm-scale sensitivity.

Original languageEnglish
Title of host publication2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728104690
DOIs
Publication statusPublished - Jun 2019
Event2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 - Munich, Germany
Duration: Jun 23 2019Jun 27 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Conference

Conference2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
CountryGermany
CityMunich
Period6/23/196/27/19

ASJC Scopus subject areas

  • Spectroscopy
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications

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    Lovasz, B., Sandor, P., Papa, Z., Eles, B., Banhegyi, B., Racz, P., Prietl, C., Krenn, J. R., & Dombi, P. (2019). Few-femtosecond plasmon transients probed with nm-scale sensitivity. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 [8872915] (2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOE-EQEC.2019.8872915