Femtosecond, single shot measurement of the dynamics of transient reflection from ablated polymer surfaces

B. Racz, G. Szabo, B. Hopp, Z. Bor, D. Xenakis, C. Fotakis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The transient behaviour of the reflectivity of polymer surfaces during femtosecond UV irradiation was measured. A novel, single shot method is described that is based on an oblique probe beam scanning across the ablated surface.

Original languageEnglish
Title of host publication17th Congress of the International Commission for Optics
Subtitle of host publicationOptics for Science and New Technology
Pages674-675
Number of pages2
EditionPART 2
Publication statusPublished - Dec 1 1996
Event17th Congress of the International Commission for Optics: Optics for Science and New Technology, ICO 1996 - Taejon, Korea, Republic of
Duration: Aug 19 1996Aug 23 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
NumberPART 2
Volume2778
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

Other17th Congress of the International Commission for Optics: Optics for Science and New Technology, ICO 1996
CountryKorea, Republic of
CityTaejon
Period8/19/968/23/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Racz, B., Szabo, G., Hopp, B., Bor, Z., Xenakis, D., & Fotakis, C. (1996). Femtosecond, single shot measurement of the dynamics of transient reflection from ablated polymer surfaces. In 17th Congress of the International Commission for Optics: Optics for Science and New Technology (PART 2 ed., pp. 674-675). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2778, No. PART 2).