Femtosecond pulse shaping using a liquid-crystal display

Applications to depth profiling analysis

Ota Samek, Vanja Hommes, Roland Hergenröder, S. Kukhlevsky

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

We report on a beam shaping technique for femtosecond laser pulses based on a liquid-crystal display. The system is capable of modifying femtosecond Gaussian beams to a flattop beam. A pattern projected onto liquid-crystal display modifies the incoming Gaussian beam intensity so that flattop intensity profile is obtained. The process is monitored online using a charge-coupled device camera so that the intensity distribution of each pulse is known. An experimental example of the depth profile of a Cr layer on a Si substrate obtained using such a modified beam is presented.

Original languageEnglish
Article number086104
Pages (from-to)1-3
Number of pages3
JournalReview of Scientific Instruments
Volume76
Issue number8
DOIs
Publication statusPublished - Aug 2005

Fingerprint

Pulse shaping
Gaussian beams
Depth profiling
Ultrashort pulses
Liquid crystal displays
liquid crystals
CCD cameras
pulses
Substrates
profiles
charge coupled devices
cameras
lasers

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Femtosecond pulse shaping using a liquid-crystal display : Applications to depth profiling analysis. / Samek, Ota; Hommes, Vanja; Hergenröder, Roland; Kukhlevsky, S.

In: Review of Scientific Instruments, Vol. 76, No. 8, 086104, 08.2005, p. 1-3.

Research output: Contribution to journalArticle

@article{892e9d16848b43bf93fedeee09529787,
title = "Femtosecond pulse shaping using a liquid-crystal display: Applications to depth profiling analysis",
abstract = "We report on a beam shaping technique for femtosecond laser pulses based on a liquid-crystal display. The system is capable of modifying femtosecond Gaussian beams to a flattop beam. A pattern projected onto liquid-crystal display modifies the incoming Gaussian beam intensity so that flattop intensity profile is obtained. The process is monitored online using a charge-coupled device camera so that the intensity distribution of each pulse is known. An experimental example of the depth profile of a Cr layer on a Si substrate obtained using such a modified beam is presented.",
author = "Ota Samek and Vanja Hommes and Roland Hergenr{\"o}der and S. Kukhlevsky",
year = "2005",
month = "8",
doi = "10.1063/1.1994897",
language = "English",
volume = "76",
pages = "1--3",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "8",

}

TY - JOUR

T1 - Femtosecond pulse shaping using a liquid-crystal display

T2 - Applications to depth profiling analysis

AU - Samek, Ota

AU - Hommes, Vanja

AU - Hergenröder, Roland

AU - Kukhlevsky, S.

PY - 2005/8

Y1 - 2005/8

N2 - We report on a beam shaping technique for femtosecond laser pulses based on a liquid-crystal display. The system is capable of modifying femtosecond Gaussian beams to a flattop beam. A pattern projected onto liquid-crystal display modifies the incoming Gaussian beam intensity so that flattop intensity profile is obtained. The process is monitored online using a charge-coupled device camera so that the intensity distribution of each pulse is known. An experimental example of the depth profile of a Cr layer on a Si substrate obtained using such a modified beam is presented.

AB - We report on a beam shaping technique for femtosecond laser pulses based on a liquid-crystal display. The system is capable of modifying femtosecond Gaussian beams to a flattop beam. A pattern projected onto liquid-crystal display modifies the incoming Gaussian beam intensity so that flattop intensity profile is obtained. The process is monitored online using a charge-coupled device camera so that the intensity distribution of each pulse is known. An experimental example of the depth profile of a Cr layer on a Si substrate obtained using such a modified beam is presented.

UR - http://www.scopus.com/inward/record.url?scp=26444537069&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=26444537069&partnerID=8YFLogxK

U2 - 10.1063/1.1994897

DO - 10.1063/1.1994897

M3 - Article

VL - 76

SP - 1

EP - 3

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 8

M1 - 086104

ER -