Fast MSM InP detectors for measurement of X-ray emission from laser plasmas

L. Ryć, F. Dubecký, A. Kozłowska, J. Krása, B. Králikowa, M. Pfeifer, P. Parys, B. Pura, F. Riesz, K. Rohlena, J. Skála, J. Ullschmied

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Measurements of intense short x-ray pulses with the use of a photoconducting InP detector are reported. The source of the x-ray pulses is plasma generated by a 1-kJ laser in Prague (the PALS). The detector is fabricated on a semiinsulating material. The contribution contains a description of the whole detection system as well as the methods used for testing.

Original languageEnglish
Title of host publicationASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes
EditorsJ. Osvald, S. Hascik, J. Osvald, S. Hascik
Pages183-186
Number of pages4
Publication statusPublished - Dec 1 2004
EventASDAM 2004 - 5th International Conference on Semiconductor Devices and Microsystmes - Smolenics Castle, Slovakia
Duration: Oct 17 2004Oct 21 2004

Publication series

NameASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes

Other

OtherASDAM 2004 - 5th International Conference on Semiconductor Devices and Microsystmes
CountrySlovakia
CitySmolenics Castle
Period10/17/0410/21/04

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ryć, L., Dubecký, F., Kozłowska, A., Krása, J., Králikowa, B., Pfeifer, M., Parys, P., Pura, B., Riesz, F., Rohlena, K., Skála, J., & Ullschmied, J. (2004). Fast MSM InP detectors for measurement of X-ray emission from laser plasmas. In J. Osvald, S. Hascik, J. Osvald, & S. Hascik (Eds.), ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes (pp. 183-186). (ASDAM 2004 - Conference Proceedings, 5th International Conference on Semiconductor Devices and Microsystmes).