Failure analysis results systematization

Csaba Nagynémedi, Endre Harkai, Dániel Rigler, Róbert Kovács, Bálint Balogh, P. Gordon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

At the Department of Electronics Technology high amount of failure analysis inspections have been carried out during the last five years, thus an outstanding number of results and reports have been accumulated by the Failure Analysis Group. The results and experiences gained in the past by these analyses can provide useful information in the present and future in further cases which show similarities to former problems. Such knowledge can only be exploited if the analysis results are organized in a suitable structure and the researchers do not have to rely on their own memory. A suitable system should handle queries based on various approaches i.e. type of failure, involved component, during which process the failure occurred, applied analysis method, etc. So the analysis result storage system has to provide a possibility to find any earlier analysis result which can be in connection with current cases to provide us the previously gained experiences and conclusions. In case a lecturer wants to illustrate a presentation with images of a certain failure type or of a given analysis method then the time needed to find the right pictures can be significantly reduced by the help of the analysis database.

Original languageEnglish
Title of host publicationISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings
DOIs
Publication statusPublished - 2009
EventISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Brno, Czech Republic
Duration: May 13 2009May 17 2009

Other

OtherISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics
CountryCzech Republic
CityBrno
Period5/13/095/17/09

Fingerprint

Failure analysis
Electronic equipment
Inspection
Data storage equipment

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Nagynémedi, C., Harkai, E., Rigler, D., Kovács, R., Balogh, B., & Gordon, P. (2009). Failure analysis results systematization. In ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings [5207016] https://doi.org/10.1109/ISSE.2009.5207016

Failure analysis results systematization. / Nagynémedi, Csaba; Harkai, Endre; Rigler, Dániel; Kovács, Róbert; Balogh, Bálint; Gordon, P.

ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings. 2009. 5207016.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nagynémedi, C, Harkai, E, Rigler, D, Kovács, R, Balogh, B & Gordon, P 2009, Failure analysis results systematization. in ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings., 5207016, ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics, Brno, Czech Republic, 5/13/09. https://doi.org/10.1109/ISSE.2009.5207016
Nagynémedi C, Harkai E, Rigler D, Kovács R, Balogh B, Gordon P. Failure analysis results systematization. In ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings. 2009. 5207016 https://doi.org/10.1109/ISSE.2009.5207016
Nagynémedi, Csaba ; Harkai, Endre ; Rigler, Dániel ; Kovács, Róbert ; Balogh, Bálint ; Gordon, P. / Failure analysis results systematization. ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings. 2009.
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