Extended reverse Monte Carlo method for extracting optical constants of thin Ni film from reflection electron energy-loss spectroscopy

H. Xu, B. Da, S. F. Mao, K. Tokési, Z. J. Ding

Research output: Contribution to journalConference article

Abstract

An extended reverse Monte Carlo (RMC) method for obtaining optical constants of ultrathin films and solids is presented. Our results show that this method works very well in extracting some exquisite information from experimentally measured reflection electron energy loss spectroscopy (REELS) spectra. The energy loss function (ELF) of 100 nm nickel film in a relatively larger energy loss range of 0-200 eV has been obtained, which agrees well with other computational data. Employing this ELF, individual contributions to REELS intensity due to surface and bulk plasmon excitations are quantitatively separated for further study.

Original languageEnglish
Article number062016
JournalJournal of Physics: Conference Series
Volume635
Issue number6
DOIs
Publication statusPublished - Sep 7 2015
Event29th International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2015 - Toledo, Spain
Duration: Jul 22 2015Jul 28 2015

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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