Experimental study of spectral parameters of silicon-vacancy centers in mwcvd nanodiamond films important for sensing applications

L. Himics, M. Veres, S. Tóth, I. Rigó, M. Koós

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Microwave enhanced chemical vapor deposition (MWCVD) was used to prepare nanodiamond (ND) films with different process parameters containing silicon-vacancy (SiV) centers. The effect of the local environment on the spectral parameters of SiV center’s zero phonon line emission, like peak position and full width at half maximum (FWHM), being important for many applications, have been studied in films having different morphological and structural properties. Relationships between the residual internal stress of the nanodiamond films and the emission parameters of the SiV centers were found and explained by shifting of the electronic levels of ground and excited states of individual SiV centers within the probed SiV ensembles due to the internal stress.

Original languageEnglish
Title of host publicationNATO Science for Peace and Security Series B
Subtitle of host publicationPhysics and Biophysics
PublisherSpringer Verlag
Pages215-220
Number of pages6
DOIs
Publication statusPublished - Jan 1 2018

Publication series

NameNATO Science for Peace and Security Series B: Physics and Biophysics
VolumePart F2
ISSN (Print)1874-6500

Keywords

  • Nanodiamond
  • Photoluminescence
  • Silicon-vacancy center
  • Spectral parameters of ZPL

ASJC Scopus subject areas

  • Biotechnology
  • Biophysics
  • Physics and Astronomy(all)
  • Electrical and Electronic Engineering

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    Himics, L., Veres, M., Tóth, S., Rigó, I., & Koós, M. (2018). Experimental study of spectral parameters of silicon-vacancy centers in mwcvd nanodiamond films important for sensing applications. In NATO Science for Peace and Security Series B: Physics and Biophysics (pp. 215-220). (NATO Science for Peace and Security Series B: Physics and Biophysics; Vol. Part F2). Springer Verlag. https://doi.org/10.1007/978-94-024-1298-7_20