Experimental method for resolution calibration of electron spectrometers

L. Kövér, J. Toth, I. Cserny, A. Itoh

Research output: Contribution to journalArticle

Abstract

A series of X-ray photoelectron spectroscopic (XPS) measurements for testing the performance and determining the spectrometer function of electron spectrometers is described. The method is based on the determination of the Rh 3d5/2 natural line width in Rh metal by the help of the Coster-Kronig broadening and Auger intensity ratio evaluated from the Rh 3d3/2 and M45N45N45 Auger spectra, respectively. Applicability of the method is demonstrated in the case of different electron spectrometers, comparing the data obtained in this way to the results of an alternative procedure based on the analysis of conduction band photoelectron spectra of Rh metal samples.

Original languageEnglish
Pages (from-to)228
Number of pages1
JournalVacuum
Volume40
Issue number1-2
Publication statusPublished - 1990

Fingerprint

Spectrometers
Calibration
spectrometers
Photoelectrons
Electrons
photoelectrons
Metals
electrons
Conduction bands
Linewidth
metals
conduction bands
X rays
Testing
x rays

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Experimental method for resolution calibration of electron spectrometers. / Kövér, L.; Toth, J.; Cserny, I.; Itoh, A.

In: Vacuum, Vol. 40, No. 1-2, 1990, p. 228.

Research output: Contribution to journalArticle

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