Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies

G. Gergely, S. Gurban, M. Menyhárd, A. Jablonski, J. Zemek, K. Goto

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Electron spectra are generally presented in arbitrary units. The experimental elastic peak intensity Iespec(E) is determined by the elastic backscattering probability Ie(E) of electrons backscattered elastically within the solid angle of the spectrometer. The experimental elastic peak Iespec(E) is converted to Ie(E) backscattering probability using our new procedure based on the Goto ie(E) elastic backscattering current database. The elastic backscattering probability I c(E) was calculated applying the EPESWIN software of Jablonski. Ie(E) <Ic(E) due to the surface losses of electrons, characterized by the surface excitation parameter Pse (SEP). P se(E) was determined experimentally using the Goto database and the relationship of Tanuma. Our new procedure is applied to angular-resolved (AREPES) spectra of Jablonski and Zemek presented in arbitrary units. In their AREPES experiments, the experimental elastic peak intensity Iespec = Ie(E, αd, ΔΩ) was measured at αd angle of detection (35-74°) with a small HSA, with ΔΩ solid angle. The experimental value at 42° Ie(E, 42°, ΔΩ) was converted to probability with the Goto database. It was corrected with a SEP parameter Pse, determined by trial and error method for Si, Ni, Cu and Ag for E = 0.5 and 1 keV primary energies.

Original languageEnglish
Pages (from-to)1365-1370
Number of pages6
JournalSurface and Interface Analysis
Volume43
Issue number11
DOIs
Publication statusPublished - Nov 2011

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Backscattering
backscattering
Electrons
excitation
electrons
energy
Spectrometers
spectrometers
computer programs
Experiments

Keywords

  • AES
  • AREPES
  • backscattering probability
  • EPES
  • SEP
  • XPS

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies. / Gergely, G.; Gurban, S.; Menyhárd, M.; Jablonski, A.; Zemek, J.; Goto, K.

In: Surface and Interface Analysis, Vol. 43, No. 11, 11.2011, p. 1365-1370.

Research output: Contribution to journalArticle

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