Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis

G. Kiss, E. B. Várhegyi, J. Mizsei, O. H. Krafcsik, K. Kovács, G. Négyesi, B. Ostrick, H. Meixner, F. Réti

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Work function gas sensors are normally operating on the principle of potential difference measurements. In this work, the change of the work function (ΔΦ) of the Pt (<1 nm)/Cu layer structure was studied in function of the sample's heat treatment temperature (23-300°C) in response of 2000 ppm CO using a Kelvin probe with a gold grid reference electrode. The aim of the heat treatment was the forming of the 'proper size' Pt clusters by Pt diffusion. It was studied by XPS analysis. In each case it was found that the introduction of the CO decreases the work function by 6-55 mV at room temperature. The optimal heat treatment conditions were determined, as 200°C, 1 h, when the change of the work function was 9 mV beside 17 s response and recovery times.

Original languageEnglish
Pages (from-to)240-243
Number of pages4
JournalSensors and Actuators, B: Chemical
Volume68
Issue number1
DOIs
Publication statusPublished - Aug 25 2000

Fingerprint

Carbon Monoxide
X ray photoelectron spectroscopy
examination
heat treatment
probes
Heat treatment
Chemical sensors
Gold
recovery
grids
gold
Recovery
Temperature
Electrodes
electrodes
sensors
room temperature
gases
temperature

ASJC Scopus subject areas

  • Analytical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

Cite this

Kiss, G., Várhegyi, E. B., Mizsei, J., Krafcsik, O. H., Kovács, K., Négyesi, G., ... Réti, F. (2000). Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis. Sensors and Actuators, B: Chemical, 68(1), 240-243. https://doi.org/10.1016/S0925-4005(00)00435-4

Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis. / Kiss, G.; Várhegyi, E. B.; Mizsei, J.; Krafcsik, O. H.; Kovács, K.; Négyesi, G.; Ostrick, B.; Meixner, H.; Réti, F.

In: Sensors and Actuators, B: Chemical, Vol. 68, No. 1, 25.08.2000, p. 240-243.

Research output: Contribution to journalArticle

Kiss, G, Várhegyi, EB, Mizsei, J, Krafcsik, OH, Kovács, K, Négyesi, G, Ostrick, B, Meixner, H & Réti, F 2000, 'Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis', Sensors and Actuators, B: Chemical, vol. 68, no. 1, pp. 240-243. https://doi.org/10.1016/S0925-4005(00)00435-4
Kiss, G. ; Várhegyi, E. B. ; Mizsei, J. ; Krafcsik, O. H. ; Kovács, K. ; Négyesi, G. ; Ostrick, B. ; Meixner, H. ; Réti, F. / Examination of the CO/Pt/Cu layer structure with Kelvin probe and XPS analysis. In: Sensors and Actuators, B: Chemical. 2000 ; Vol. 68, No. 1. pp. 240-243.
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