Abstract
An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - IEEE International Symposium on Circuits and Systems |
| Publisher | Publ by IEEE |
| Pages | 1585-1588 |
| Number of pages | 4 |
| Volume | 3 |
| Publication status | Published - 1991 |
| Event | 1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) - Singapore, Singapore Duration: Jun 11 1991 → Jun 14 1991 |
Other
| Other | 1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) |
|---|---|
| City | Singapore, Singapore |
| Period | 6/11/91 → 6/14/91 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
Cite this
Exact noise analysis of 'ideal' SC networks. / Tóth, L.; Suyama, K.
Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 3 Publ by IEEE, 1991. p. 1585-1588.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Exact noise analysis of 'ideal' SC networks
AU - Tóth, L.
AU - Suyama, K.
PY - 1991
Y1 - 1991
N2 - An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.
AB - An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.
UR - http://www.scopus.com/inward/record.url?scp=0026403001&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0026403001&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0026403001
VL - 3
SP - 1585
EP - 1588
BT - Proceedings - IEEE International Symposium on Circuits and Systems
PB - Publ by IEEE
ER -