An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.
|Number of pages||4|
|Journal||Proceedings - IEEE International Symposium on Circuits and Systems|
|Publication status||Published - Dec 1 1991|
|Event||1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) - Singapore, Singapore|
Duration: Jun 11 1991 → Jun 14 1991
ASJC Scopus subject areas
- Electrical and Electronic Engineering