Exact noise analysis of 'ideal' SC networks

L. Toth, K. Suyama

Research output: Contribution to journalConference article

12 Citations (Scopus)

Abstract

An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.

Original languageEnglish
Pages (from-to)1585-1588
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume3
Publication statusPublished - Dec 1 1991
Event1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) - Singapore, Singapore
Duration: Jun 11 1991Jun 14 1991

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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