### Abstract

An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.

Original language | English |
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Title of host publication | Proceedings - IEEE International Symposium on Circuits and Systems |

Publisher | Publ by IEEE |

Pages | 1585-1588 |

Number of pages | 4 |

Volume | 3 |

Publication status | Published - 1991 |

Event | 1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) - Singapore, Singapore Duration: Jun 11 1991 → Jun 14 1991 |

### Other

Other | 1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) |
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City | Singapore, Singapore |

Period | 6/11/91 → 6/14/91 |

### Fingerprint

### ASJC Scopus subject areas

- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials

### Cite this

*Proceedings - IEEE International Symposium on Circuits and Systems*(Vol. 3, pp. 1585-1588). Publ by IEEE.

**Exact noise analysis of 'ideal' SC networks.** / Tóth, L.; Suyama, K.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*Proceedings - IEEE International Symposium on Circuits and Systems.*vol. 3, Publ by IEEE, pp. 1585-1588, 1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5), Singapore, Singapore, 6/11/91.

}

TY - GEN

T1 - Exact noise analysis of 'ideal' SC networks

AU - Tóth, L.

AU - Suyama, K.

PY - 1991

Y1 - 1991

N2 - An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.

AB - An exact analytical method is presented for computing noise generated in switched capacitor networks (SCNs) including the effects due to frequency-dependent low-frequency (i.e. 1/f noise) as well as broadband noise sources. The low-frequency noise source is modeled by the square of the magnitude of a rational function. A lossy SCN containing finite ON-resistances associated with MOS switches exhibits a well-defined output noise even when a limit-value computation is used to force the resistances to zero. The limit-value computation technique to determine this remaining average power spectral density takes advantage of the complete-charge-transfer assumption fully, and thus leads to an efficient noise analysis. The technique avoids the computation of eigenvalues or matrix exponentials even though the ON-resistors must be formulated.

UR - http://www.scopus.com/inward/record.url?scp=0026403001&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026403001&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0026403001

VL - 3

SP - 1585

EP - 1588

BT - Proceedings - IEEE International Symposium on Circuits and Systems

PB - Publ by IEEE

ER -