Evolution of the dislocation microstructure: A model based on X-ray line profile measurements

I. Groma, F. Székely

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

X-ray line profile analysis is an efficient non-destructive technique to determine some key statistical properties of the dislocation structures developing during plastic deformation. In the first part of the paper, X-ray line profile measurements obtained on compressed Cu single crystals are presented. After this a simple dislocation density evolution model based on the experimental results is proposed.

Original languageEnglish
Pages (from-to)753-757
Number of pages5
JournalScripta Materialia
Volume54
Issue number5
DOIs
Publication statusPublished - Mar 2006

Fingerprint

X rays
microstructure
Microstructure
profiles
plastic deformation
Plastic deformation
x rays
Single crystals
single crystals

Keywords

  • Dislocations
  • Modelling of stage III
  • X-ray profile analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Metals and Alloys

Cite this

Evolution of the dislocation microstructure : A model based on X-ray line profile measurements. / Groma, I.; Székely, F.

In: Scripta Materialia, Vol. 54, No. 5, 03.2006, p. 753-757.

Research output: Contribution to journalArticle

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