Evolution of structure with spacer layer thickness in electrodeposited CoCu multilayers

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Abstract

An X-ray diffraction study of electrodeposited CoCu multilayers with Cu layer thicknesses (dCu) from 0.5 to 4.5 nm revealed that, from structural point of view, three thickness ranges can be distinguished. For dCu <2 nm, a few percent of hexagonal close-packed (hcp)-Co fraction is present and no superlattice satellite peaks can be observed. For dCu > 2 nm, no hcp reflections can be detected whereas clear satellite reflections appear for 2 nm< dCu <4 nm around the main face-centered cubic (fcc)(111) reflection. For dCu >4 nm, these satellite peaks can hardly be seen again. These findings can be explained by the presence of pinholes in the Cu layers for dCu < 2 nm, the formation of a coherent superlattice structure for 2 nm< dCu < 4 nm and the degradation of the multilayer structural quality for dCu > 4 nm. The intermediate Cu thickness range is also characterized by the strongest fcc(111) texture and by the largest structural perfectness. These structural data will be very helpful in explaining magnetoresistance results on the same multilayers.

Original languageEnglish
Pages (from-to)D688-D692
JournalJournal of the Electrochemical Society
Volume155
Issue number11
DOIs
Publication statusPublished - Oct 1 2008

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films
  • Electrochemistry
  • Materials Chemistry

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