Evaluation of the armstrong–buseck correction for automated electron probe X‐ray microanalysis of particles

Hedwig M. Storms, Koen H. Janssens, Szabina B. Török, René E. Van Grieken

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The Armstrong–Buseck correction for absorption effects in electron probe x‐ray microanalysis of particles considers seven specific particle shapes, and for these geometries exact correction equations are used. This procedure implies that the analyst has to associate the particle to be analysed with a certain particle type; an arbitrary relative thickness is sometimes assumed. A theoretical study was made of this absorption correction as a function of the particle composition, type and thickness for micrometre‐sized particles. It appears that a correct choice of the particle type is critical. However, when the analytical results are normalized to 100%, the differences between the models are much less pronounced, and it is justified to assume a spherical model in all cases.

Original languageEnglish
Pages (from-to)45-52
Number of pages8
JournalX‐Ray Spectrometry
Volume18
Issue number2
DOIs
Publication statusPublished - Apr 1989

ASJC Scopus subject areas

  • Spectroscopy

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