Evaluation of Schottky junction parameters from current-voltage characteristics exhibiting large excess currents

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A new method is presented to extract the junction parameters from current-voltage characteristics of Schottky junctions exhibiting high leakage or other excess currents at low bias and current levels, for reduction of errors and uncertainity of the evaluation. In contrary to the Richardson plot, using the new method presented here, the Schottky junction parameters are evaluated from the measured experimental points directly instead of the extrapolated values of saturation current. The temperature dependence of forward bias, which is necessary for a given thermionic emission current level, is used. After transformation of the data, a linear plot is obtained, which yields both the barrier height and effective Richardson constant.

Original languageEnglish
Pages (from-to)743-745
Number of pages3
JournalApplied Surface Science
Volume255
Issue number3
DOIs
Publication statusPublished - Nov 30 2008

Keywords

  • Current-voltage characteristics
  • GaInAsSb
  • InP
  • Leakage currents
  • Parameter extraction
  • Schottky junction

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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