Erratum

Nonsingular dislocation and crack fields: Implications to small volumes (Microsyst Technol (2009) 15:117121 DOI 10.1007/s00542-008-0700-6)

J. Kioseoglou, I. Konstantopoulos, G. Ribárik, G. P. Dimitrakopulos, E. C. Aifantis

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1897
Number of pages1
JournalMicrosystem Technologies
Volume15
Issue number12
DOIs
Publication statusPublished - Dec 2009

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cracks
Cracks

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Erratum : Nonsingular dislocation and crack fields: Implications to small volumes (Microsyst Technol (2009) 15:117121 DOI 10.1007/s00542-008-0700-6). / Kioseoglou, J.; Konstantopoulos, I.; Ribárik, G.; Dimitrakopulos, G. P.; Aifantis, E. C.

In: Microsystem Technologies, Vol. 15, No. 12, 12.2009, p. 1897.

Research output: Contribution to journalArticle

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