Entanglement entropy with localized and extended interface defects

F. Iglói, Zsolt Szatmári, Yu Cheng Lin

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

The quantum Ising chain of length, L, which is separated into two parts by localized or extended defects is considered at the critical point where scaling of the interface magnetization is nonuniversal. We measure the entanglement entropy between the two halves of the system in equilibrium, as well as after a quench, when the interaction at the interface is changed for time t>0. For the localized defect the increase in the entropy with logL or with logt involves the same effective central charge, which is a continuous function of the strength of the defect. On the contrary for the extended defect the equilibrium entropy is saturated but the nonequilibrium entropy has a logarithmic time dependence the prefactor of which depends on the strength of the defect.

Original languageEnglish
Article number024405
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number2
DOIs
Publication statusPublished - Aug 6 2009

Fingerprint

Entropy
entropy
Defects
defects
time dependence
Magnetization
critical point
scaling
magnetization
interactions

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Entanglement entropy with localized and extended interface defects. / Iglói, F.; Szatmári, Zsolt; Lin, Yu Cheng.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 80, No. 2, 024405, 06.08.2009.

Research output: Contribution to journalArticle

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