Endoergic and resonant charge transfer excitation in He-Cu discharge

P. Mezei, K. Rózsa, M. Jánossy, P. Apai

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9 Citations (Scopus)


The intensity of Cu-II lines with upper level energies near and above those of the He ion was measured as a function of He pressure in a Cu hollow cathode tube. In this tube at low pressures the negative glow could expand above the cathode. The maximum intensity of the Cu-II 493.1 nm line was found in the low voltage, high pressure hollow cathode discharge region in accordance with a resonant charge transfer excitation process. Enhancement of the intensity of the Cu-II 436.5 nm and 417.9 nm lines was observed in the cathode glow at low pressures. Excitation of these lines is attributed to endoergic charge transfer collisions between He ions accelerated by the 2 kV tube voltage and ground state Cu atoms. The cross-section for this reaction exciting the 436.5 nm line was estimated to be of the order of 10-17 cm2.

Original languageEnglish
Pages (from-to)71-74
Number of pages4
JournalApplied Physics B Photophysics and Laser Chemistry
Issue number1
Publication statusPublished - Sep 1 1987


  • 34
  • 42.55C
  • 52

ASJC Scopus subject areas

  • Engineering(all)

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