Empirical approach to the description of spectral performance degradation of silicon photodiodes used as particle detectors

G. Kalinka, M. Novák, A. Simon, Ž Pastuović, M. Jakšić, Á Z. Kiss

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The spectral deterioration of Hamamatsu S5821 silicon photodiodes for ion types and energies frequently used in Ion Beam Analysis was investigated. Focused proton beams with energies 430 keV and 2 MeV were applied to generate radiation damage via an area selective ion implantation in unbiased diodes at room temperature. The variations of spectroscopic features were measured "in situ" by Ion Beam Induced Current (IBIC) method as a function of fluence, within the 109-5 × 1012 ion/cm2 range and diode bias voltages, between 0 and 100 V. An empirical model has been developed to describe the radiation damage. Equations are derived for the variations of the normalized peak position and peak width. The derived empirical equations are physically correct, as far as they account for the superposition of the influence of charge carrier trapping by native and radiation-induced defects and for the effect of charge carrier velocity saturation with electric field strength, as well.

Original languageEnglish
Pages (from-to)2203-2207
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume267
Issue number12-13
DOIs
Publication statusPublished - Jun 15 2009

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Keywords

  • Charge collection efficiency
  • Energy resolution
  • IBIC
  • Microbeam
  • Radiation damage
  • Si pin photodiode

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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