Emerging standard for thermal testing of power LEDs and its possible implementation

A. Poppe, Gábor Farkas, Gábor Molnár, Balázs Katona, Tamás Temesvölgyi, Jimmy Weikun He

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

Nowadays the demand for thermal standards for power LEDs is increasing. On one hand metrics for fair comparison of competing products are needed; on the other hand, designers of power LED-based applications need reliable and meaningful data for their daily work. Today's data sheet information does hardly meet any of these requirements. In 2008 the JEDEC JC15 committee on thermal standardization of semiconductor devices decided to take action and created a task group to deal with thermal standardization issues of power LEDs. CIE has also created two new technical committees (TC2-63, TC2-64) which also aim to address thermal issues during measurement of high brightness / high power LEDs. This paper deals with thermal issues that are specific to light emitting diodes by describing novel test methods which may form basis of new measurement guidelines or standards including combined thermal and radiometric measurement of LEDs. Thermal issues in connection with short pulse measurements of LEDs and some thermal aspects of LM80 tests are also discussed.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7784
DOIs
Publication statusPublished - 2010
Event10th International Conference on Solid State Lighting - San Diego, CA, United States
Duration: Aug 2 2010Aug 4 2010

Other

Other10th International Conference on Solid State Lighting
CountryUnited States
CitySan Diego, CA
Period8/2/108/4/10

Fingerprint

Light emitting diodes
emerging
light emitting diodes
Testing
standardization
Standardization
High Brightness
Short Pulse
Hot Temperature
Standards
Semiconductor Devices
semiconductor devices
Semiconductor devices
Diode
High Power
brightness
Luminance
requirements
Metric
products

Keywords

  • Junction temperature
  • LED thermal testing
  • LEDs' real thermal resistance
  • Short pulse tests
  • Thermal aspects of LM80 tests

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Poppe, A., Farkas, G., Molnár, G., Katona, B., Temesvölgyi, T., & He, J. W. (2010). Emerging standard for thermal testing of power LEDs and its possible implementation. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7784). [778414] https://doi.org/10.1117/12.864054

Emerging standard for thermal testing of power LEDs and its possible implementation. / Poppe, A.; Farkas, Gábor; Molnár, Gábor; Katona, Balázs; Temesvölgyi, Tamás; He, Jimmy Weikun.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7784 2010. 778414.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Poppe, A, Farkas, G, Molnár, G, Katona, B, Temesvölgyi, T & He, JW 2010, Emerging standard for thermal testing of power LEDs and its possible implementation. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7784, 778414, 10th International Conference on Solid State Lighting, San Diego, CA, United States, 8/2/10. https://doi.org/10.1117/12.864054
Poppe A, Farkas G, Molnár G, Katona B, Temesvölgyi T, He JW. Emerging standard for thermal testing of power LEDs and its possible implementation. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7784. 2010. 778414 https://doi.org/10.1117/12.864054
Poppe, A. ; Farkas, Gábor ; Molnár, Gábor ; Katona, Balázs ; Temesvölgyi, Tamás ; He, Jimmy Weikun. / Emerging standard for thermal testing of power LEDs and its possible implementation. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7784 2010.
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