Ellipsometry of semiconductor nanocrystals

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1 Citation (Scopus)

Abstract

In this chapter we make an attempt to give a comprehensive overview on the optical modeling of layer structures that accommodate or are entirely composed of semiconductor nanocrystals. This research field is huge both in terms of the theories of effective dielectric functions and applications. The dielectric function of singlecrystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.

Original languageEnglish
Title of host publicationEllipsometry at the Nanoscale
PublisherSpringer Berlin Heidelberg
Pages583-606
Number of pages24
ISBN (Electronic)9783642339561
ISBN (Print)9783642339554
DOIs
Publication statusPublished - Jan 1 2013

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Petrik, P., & Fried, M. (2013). Ellipsometry of semiconductor nanocrystals. In Ellipsometry at the Nanoscale (pp. 583-606). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-33956-1