Ellipsometry of semiconductor nanocrystals

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

In this chapter we make an attempt to give a comprehensive overview on the optical modeling of layer structures that accommodate or are entirely composed of semiconductor nanocrystals. This research field is huge both in terms of the theories of effective dielectric functions and applications. The dielectric function of singlecrystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.

Original languageEnglish
Title of host publicationEllipsometry at the Nanoscale
PublisherSpringer Berlin Heidelberg
Pages583-606
Number of pages24
ISBN (Print)9783642339561, 9783642339554
DOIs
Publication statusPublished - Jan 1 2013

Fingerprint

Ellipsometry
Nanocrystals
Semiconductor materials
Contamination
Oxides

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Petrik, P., & Fried, M. (2013). Ellipsometry of semiconductor nanocrystals. In Ellipsometry at the Nanoscale (pp. 583-606). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-33956-1

Ellipsometry of semiconductor nanocrystals. / Petrik, P.; Fried, M.

Ellipsometry at the Nanoscale. Springer Berlin Heidelberg, 2013. p. 583-606.

Research output: Chapter in Book/Report/Conference proceedingChapter

Petrik, P & Fried, M 2013, Ellipsometry of semiconductor nanocrystals. in Ellipsometry at the Nanoscale. Springer Berlin Heidelberg, pp. 583-606. https://doi.org/10.1007/978-3-642-33956-1
Petrik P, Fried M. Ellipsometry of semiconductor nanocrystals. In Ellipsometry at the Nanoscale. Springer Berlin Heidelberg. 2013. p. 583-606 https://doi.org/10.1007/978-3-642-33956-1
Petrik, P. ; Fried, M. / Ellipsometry of semiconductor nanocrystals. Ellipsometry at the Nanoscale. Springer Berlin Heidelberg, 2013. pp. 583-606
@inbook{35e4c9f24b174fd69f1e79df6a546eae,
title = "Ellipsometry of semiconductor nanocrystals",
abstract = "In this chapter we make an attempt to give a comprehensive overview on the optical modeling of layer structures that accommodate or are entirely composed of semiconductor nanocrystals. This research field is huge both in terms of the theories of effective dielectric functions and applications. The dielectric function of singlecrystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.",
author = "P. Petrik and M. Fried",
year = "2013",
month = "1",
day = "1",
doi = "10.1007/978-3-642-33956-1",
language = "English",
isbn = "9783642339561",
pages = "583--606",
booktitle = "Ellipsometry at the Nanoscale",
publisher = "Springer Berlin Heidelberg",

}

TY - CHAP

T1 - Ellipsometry of semiconductor nanocrystals

AU - Petrik, P.

AU - Fried, M.

PY - 2013/1/1

Y1 - 2013/1/1

N2 - In this chapter we make an attempt to give a comprehensive overview on the optical modeling of layer structures that accommodate or are entirely composed of semiconductor nanocrystals. This research field is huge both in terms of the theories of effective dielectric functions and applications. The dielectric function of singlecrystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.

AB - In this chapter we make an attempt to give a comprehensive overview on the optical modeling of layer structures that accommodate or are entirely composed of semiconductor nanocrystals. This research field is huge both in terms of the theories of effective dielectric functions and applications. The dielectric function of singlecrystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.

UR - http://www.scopus.com/inward/record.url?scp=84948149191&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84948149191&partnerID=8YFLogxK

U2 - 10.1007/978-3-642-33956-1

DO - 10.1007/978-3-642-33956-1

M3 - Chapter

AN - SCOPUS:84948149191

SN - 9783642339561

SN - 9783642339554

SP - 583

EP - 606

BT - Ellipsometry at the Nanoscale

PB - Springer Berlin Heidelberg

ER -