Ellipsometric characterization of thin nanocomposite films with tunable refractive index for biochemical sensors

P. Petrik, H. Egger, S. Eiden, E. Agocs, M. Fried, B. Pecz, K. Kolari, T. Aalto, R. Horvath, D. Giannone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Creating optical quality thin films with a high refractive index is increasingly important for waveguide sensor applications. In this study, we present optical models to measure the layer thickness, vertical and lateral homogeneity, the refractive index and the extinction coefficients of the polymer films with nanocrystal inclusions using spectroscopic ellipsometry. The optical properties can be determined in a broad wavelength range from 190 to 1700 nm. The sensitivity of spectroscopic ellipsometry allows a detailed characterization of the nanostructure of the layer, i.e. the surface roughness down to the nm scale, the interface properties, the optical density profile within the layer, and any other optical parameters that can be modeled in a proper and consistent way. In case of larger than about 50 nm particles even the particle size can be determined from the onset of depolarization due to light scattering. Besides the refractive index, the extinction coefficient, being a critical parameter for waveguiding layers, was also determined in a broad wavelength range. Using the above information from the ellipsometric models the preparation conditions can be identified. A range of samples were investigated including doctor bladed films using TiO 2 nanoparticles.

Original languageEnglish
Title of host publicationTitanium Dioxide Nanomaterials
Pages81-87
Number of pages7
DOIs
Publication statusPublished - Jan 1 2012
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 25 2011Apr 29 2011

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1352
ISSN (Print)0272-9172

Other

Other2011 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/25/114/29/11

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Petrik, P., Egger, H., Eiden, S., Agocs, E., Fried, M., Pecz, B., Kolari, K., Aalto, T., Horvath, R., & Giannone, D. (2012). Ellipsometric characterization of thin nanocomposite films with tunable refractive index for biochemical sensors. In Titanium Dioxide Nanomaterials (pp. 81-87). (Materials Research Society Symposium Proceedings; Vol. 1352). https://doi.org/10.1557/opl.2011.1342