Ellipsometric characterization of flagellin films for biosensor applications

P. Kozma, N. Nagy, S. Kurunczi, P. Petrik, A. Hámori, A. Muskotál, F. Vonderviszt, M. Fried, I. Bársony

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The quality of flagellin films in terms of thickness and homogeneity was investigated by spectroscopic ellipsometry. Flagellin films were prepared in three steps: silanization, glutaraldehyde activation and finally the coating with proteins. The process of film preparation was optimized by varying the duration of the silanization and by testing sticking on different substrates including Si wafer covered with different thickness of silicon-oxide and also covered with a thin film of tantallum pentoxide. Spectroscopic ellipsometry was applied to gain in-depth information on the film properties for the optimization of the immobilization.

Original languageEnglish
Pages (from-to)1427-1430
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume5
Issue number5
DOIs
Publication statusPublished - 2008

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bioinstrumentation
ellipsometry
silicon oxides
immobilization
homogeneity
wafers
activation
proteins
coatings
preparation
optimization
thin films

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Ellipsometric characterization of flagellin films for biosensor applications. / Kozma, P.; Nagy, N.; Kurunczi, S.; Petrik, P.; Hámori, A.; Muskotál, A.; Vonderviszt, F.; Fried, M.; Bársony, I.

In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 5, No. 5, 2008, p. 1427-1430.

Research output: Contribution to journalArticle

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