Electronic transport in amorphous Ni1-xPx alloys

John P. Carini, Sidney R. Nagel, L. K. Varga, T. Schmidt

Research output: Contribution to journalArticle

52 Citations (Scopus)


We have measured the resistivity (T) and the thermoelectric power Q(T) in the metallic glass system Ni1-xPx, with 0.143x0.243, prepared by chemical deposition and melt quenching. We find that as x increases, increases, [=(1)ddT] decreases and becomes negative, and Q increases and becomes positive near x=0.18. These results agree with the Mooij correlation and with a correlation of positive Q with high and negative Q with low, which is also seen in many nonmagnetic metallic glasses. Thus the Ni1-xPx system spans the range of behavior seen in many different metallic glasses. For x0.175, (T) and Q(T) are very similar to those seen in iron-based ferromagnetic glasses. The only clear difference between the transport properties of samples prepared by melt quenching and chemical deposition is in the temperature dependence of. We compare our results with several theories for electron scattering.

Original languageEnglish
Pages (from-to)7589-7599
Number of pages11
JournalPhysical Review B
Issue number12
Publication statusPublished - Jan 1 1983

ASJC Scopus subject areas

  • Condensed Matter Physics

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