Electronic noise in silicon nitride ceramics doped by carbon allotropes

Béla Szentpáli, Péter Arató

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The electric conduction and low-frequency noise were investigated in silicon nitride-based ceramics doped with different carbon allotropes as multi-wall carbon nanotubes, black carbon and graphite powder. The electric conduction was found unstable in time. This instability does not depend on the atmosphere and on the possible variation of the temperature. The noise spectra show 1/f character, however the magnitude of the noise differ for the different dopants, and strongly depends on the pressure of sintering. The comparison of the resistance values and the noise magnitudes suggest that the carbon dopants form percolation networks. The carbon is distributed most likely at the surface of the ceramic particles like the Swiss-Cheese model.

Original languageEnglish
Title of host publicationNoise and Fluctuations in Circuits, Devices, and Materials
DOIs
Publication statusPublished - Nov 23 2007
EventNoise and Fluctuations in Circuits, Devices, and Materials - Florence, Italy
Duration: May 21 2007May 24 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6600
ISSN (Print)0277-786X

Other

OtherNoise and Fluctuations in Circuits, Devices, and Materials
CountryItaly
CityFlorence
Period5/21/075/24/07

Keywords

  • Black carbon
  • Carbon nano tubes
  • Graphite
  • Noise
  • Percolation
  • Silicon nitride ceramics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Szentpáli, B., & Arató, P. (2007). Electronic noise in silicon nitride ceramics doped by carbon allotropes. In Noise and Fluctuations in Circuits, Devices, and Materials [660021] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6600). https://doi.org/10.1117/12.724551