Electronic exchange effects in p + Ne and p + Ar collisions

T. Kirchner, L. Gulyás, H. J. Lüdde, A. Henne, E. Engel, R. M. Dreizler

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

Total cross sections for net electron loss and ionization in p + Ne and p + Ar collisions are presented with emphasis on their crucial dependence on the qualitiy of the static atomic exchange potential. In order to investigate these electronic exchange effects from different viewpoints, we have applied two theoretical models within an effective one particle picture, the continuum distorted wave with eikonal initial state approximation and a coupled-channel approach based on an optimized set of pseudostates.

Original languageEnglish
Pages (from-to)1658-1661
Number of pages4
JournalPhysical Review Letters
Volume79
Issue number9
Publication statusPublished - 1997

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continuums
ionization
collisions
cross sections
approximation
electronics
electrons

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Kirchner, T., Gulyás, L., Lüdde, H. J., Henne, A., Engel, E., & Dreizler, R. M. (1997). Electronic exchange effects in p + Ne and p + Ar collisions. Physical Review Letters, 79(9), 1658-1661.

Electronic exchange effects in p + Ne and p + Ar collisions. / Kirchner, T.; Gulyás, L.; Lüdde, H. J.; Henne, A.; Engel, E.; Dreizler, R. M.

In: Physical Review Letters, Vol. 79, No. 9, 1997, p. 1658-1661.

Research output: Contribution to journalArticle

Kirchner, T, Gulyás, L, Lüdde, HJ, Henne, A, Engel, E & Dreizler, RM 1997, 'Electronic exchange effects in p + Ne and p + Ar collisions', Physical Review Letters, vol. 79, no. 9, pp. 1658-1661.
Kirchner T, Gulyás L, Lüdde HJ, Henne A, Engel E, Dreizler RM. Electronic exchange effects in p + Ne and p + Ar collisions. Physical Review Letters. 1997;79(9):1658-1661.
Kirchner, T. ; Gulyás, L. ; Lüdde, H. J. ; Henne, A. ; Engel, E. ; Dreizler, R. M. / Electronic exchange effects in p + Ne and p + Ar collisions. In: Physical Review Letters. 1997 ; Vol. 79, No. 9. pp. 1658-1661.
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