Electron shake-off mechanism of the extended fine structure of X-ray absorption edges

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Abstract

A new mechanism for the extended fine structure of X-ray absorption edges is suggested. Electron shake-off following photo-ionization produces a positive ion and the ejected electron makes a transition into an eigenstate of the potential corresponding to this ion.

Original languageEnglish
Pages (from-to)47-48
Number of pages2
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume41
Issue number1
DOIs
Publication statusPublished - Aug 28 1972

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fine structure
positive ions
photoionization
eigenvectors
electrons
x rays
ions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

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title = "Electron shake-off mechanism of the extended fine structure of X-ray absorption edges",
abstract = "A new mechanism for the extended fine structure of X-ray absorption edges is suggested. Electron shake-off following photo-ionization produces a positive ion and the ejected electron makes a transition into an eigenstate of the potential corresponding to this ion.",
author = "T. Ung{\'a}r",
year = "1972",
month = "8",
day = "28",
doi = "10.1016/0375-9601(72)90627-5",
language = "English",
volume = "41",
pages = "47--48",
journal = "Physics Letters, Section A: General, Atomic and Solid State Physics",
issn = "0375-9601",
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AU - Ungár, T.

PY - 1972/8/28

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AB - A new mechanism for the extended fine structure of X-ray absorption edges is suggested. Electron shake-off following photo-ionization produces a positive ion and the ejected electron makes a transition into an eigenstate of the potential corresponding to this ion.

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