Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy-II. Plate crystallography

Dominique Schryvers, Ying Ma, L. Tóth, Lee Tanner

Research output: Contribution to journalArticle

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Abstract

Different twinning arrangements in Ni5Al3 plates grown inside the B2 phase in Ni62.5Al37.5 samples are descrubed on the basis of conventional and high resolution electron microscopy images and electron diffraction. The plate morphology is comparable with that of pure 2M martensite plates. The choice of ordered variants within a plate is dictated by the ordering coherency of the twin plane. No dislocations were observed at the primary plate-matrix interfaces. An explanation using the streaking due to aperiodic twinning is given for unexpected reflections.

Original languageEnglish
Pages (from-to)4057-4065
Number of pages9
JournalActa Metallurgica et Materialia
Volume43
Issue number11
DOIs
Publication statusPublished - 1995

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Crystallography
Twinning
Electron microscopy
High resolution electron microscopy
Martensite
Electron diffraction

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Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy-II. Plate crystallography. / Schryvers, Dominique; Ma, Ying; Tóth, L.; Tanner, Lee.

In: Acta Metallurgica et Materialia, Vol. 43, No. 11, 1995, p. 4057-4065.

Research output: Contribution to journalArticle

@article{26ade1b6d08540a9bd53b7a6d9bdb06d,
title = "Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy-II. Plate crystallography",
abstract = "Different twinning arrangements in Ni5Al3 plates grown inside the B2 phase in Ni62.5Al37.5 samples are descrubed on the basis of conventional and high resolution electron microscopy images and electron diffraction. The plate morphology is comparable with that of pure 2M martensite plates. The choice of ordered variants within a plate is dictated by the ordering coherency of the twin plane. No dislocations were observed at the primary plate-matrix interfaces. An explanation using the streaking due to aperiodic twinning is given for unexpected reflections.",
author = "Dominique Schryvers and Ying Ma and L. T{\'o}th and Lee Tanner",
year = "1995",
doi = "10.1016/0956-7151(95)00102-2",
language = "English",
volume = "43",
pages = "4057--4065",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Elsevier Limited",
number = "11",

}

TY - JOUR

T1 - Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy-II. Plate crystallography

AU - Schryvers, Dominique

AU - Ma, Ying

AU - Tóth, L.

AU - Tanner, Lee

PY - 1995

Y1 - 1995

N2 - Different twinning arrangements in Ni5Al3 plates grown inside the B2 phase in Ni62.5Al37.5 samples are descrubed on the basis of conventional and high resolution electron microscopy images and electron diffraction. The plate morphology is comparable with that of pure 2M martensite plates. The choice of ordered variants within a plate is dictated by the ordering coherency of the twin plane. No dislocations were observed at the primary plate-matrix interfaces. An explanation using the streaking due to aperiodic twinning is given for unexpected reflections.

AB - Different twinning arrangements in Ni5Al3 plates grown inside the B2 phase in Ni62.5Al37.5 samples are descrubed on the basis of conventional and high resolution electron microscopy images and electron diffraction. The plate morphology is comparable with that of pure 2M martensite plates. The choice of ordered variants within a plate is dictated by the ordering coherency of the twin plane. No dislocations were observed at the primary plate-matrix interfaces. An explanation using the streaking due to aperiodic twinning is given for unexpected reflections.

UR - http://www.scopus.com/inward/record.url?scp=0001210426&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0001210426&partnerID=8YFLogxK

U2 - 10.1016/0956-7151(95)00102-2

DO - 10.1016/0956-7151(95)00102-2

M3 - Article

VL - 43

SP - 4057

EP - 4065

JO - Acta Materialia

JF - Acta Materialia

SN - 1359-6454

IS - 11

ER -