Electro-thermal transistor models in the SISSI electro-thermal IC simulator

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The paper is dealing with the modeling solutions and the verification of an electro-thermal simulation program. Method to extend conventional device models to the electro-thermal ones is presented. Modeling of special electro-thermal devices as e.g. the integrated thermo-couple is discussed. In order to verify the electro-thermal models measurement and simulation results are compared. The target device of these investigations is an operational amplifier chip. Several layout arrangements are considered, and the relationship between the layout and the distortions of the electrical operation caused by the thermal feedback is discussed. As a second example the measured and simulated characteristics of a MEMS electro-thermal converter is compared. The paper deals both with steady-state and dynamic investigations.

Original languageEnglish
Title of host publicationProceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004
EditorsL.J. Ernst, G.Q. Zhang, P. Rodgers, O. Saint Leger
Pages105-112
Number of pages8
Publication statusPublished - Aug 18 2004
EventProceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004 - Brussels, Belgium
Duration: May 10 2004May 12 2004

Publication series

NameProceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004

Other

OtherProceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004
CountryBelgium
CityBrussels
Period5/10/045/12/04

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Székely, V., Poppe, A., & Hajas, G. (2004). Electro-thermal transistor models in the SISSI electro-thermal IC simulator. In L. J. Ernst, G. Q. Zhang, P. Rodgers, & O. Saint Leger (Eds.), Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004 (pp. 105-112). (Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004).