Electric and thermal transient effects in high power optical devices

Gábor Farkas, Shatil Haque, Frank Wall, Paul S. Martin, A. Poppe, Quint Van Voorst Vader, György Bognár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

41 Citations (Scopus)

Abstract

In case of opto-electronic devices the power applied on the device leaves in a parallel heat and light transport. For this reason the interpretation of R th, is not obvious. By studying electrical and thermal transients in high power LEDs this paper proposes a multi-domain "compact" model suitable for correct simulation of single devices as well as LED arrays in a board-level simulation environment. The thermal part of the model has been identified from structure functions extracted from measured thermal transients. Several measurements were carried out in a combined photometric/thermal measurement setup, which is proposed for the characterization of power LEDs. Transient simulation results compared to measured transients are also presented.

Original languageEnglish
Title of host publicationAnnual IEEE Semiconductor Thermal Measurement and Management Symposium
Pages168-176
Number of pages9
Volume20
Publication statusPublished - 2004
Event20th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Proceedings 2004 - San Jose, CA., United States
Duration: Mar 9 2004Mar 11 2004

Other

Other20th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Proceedings 2004
CountryUnited States
CitySan Jose, CA.
Period3/9/043/11/04

Fingerprint

Optical devices
light emitting diodes
Light emitting diodes
environment simulation
optoelectronic devices
leaves
simulation
heat
Optoelectronic devices
Hot Temperature

Keywords

  • Combined photometric/thermal measurement of power LEDs
  • Structure function-based thermal modeling
  • Thermal and electro-thermal simulation
  • Thermal transient measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Farkas, G., Haque, S., Wall, F., Martin, P. S., Poppe, A., Van Voorst Vader, Q., & Bognár, G. (2004). Electric and thermal transient effects in high power optical devices. In Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Vol. 20, pp. 168-176)

Electric and thermal transient effects in high power optical devices. / Farkas, Gábor; Haque, Shatil; Wall, Frank; Martin, Paul S.; Poppe, A.; Van Voorst Vader, Quint; Bognár, György.

Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Vol. 20 2004. p. 168-176.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Farkas, G, Haque, S, Wall, F, Martin, PS, Poppe, A, Van Voorst Vader, Q & Bognár, G 2004, Electric and thermal transient effects in high power optical devices. in Annual IEEE Semiconductor Thermal Measurement and Management Symposium. vol. 20, pp. 168-176, 20th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Proceedings 2004, San Jose, CA., United States, 3/9/04.
Farkas G, Haque S, Wall F, Martin PS, Poppe A, Van Voorst Vader Q et al. Electric and thermal transient effects in high power optical devices. In Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Vol. 20. 2004. p. 168-176
Farkas, Gábor ; Haque, Shatil ; Wall, Frank ; Martin, Paul S. ; Poppe, A. ; Van Voorst Vader, Quint ; Bognár, György. / Electric and thermal transient effects in high power optical devices. Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Vol. 20 2004. pp. 168-176
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