Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings

Vilmos Pálfi, I. Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper a frequency domain four-parameter sine wave fit algorithm is presented which is much faster than the standard time domain least squares fit for large number of samples, with almost the same precision. This allows the user to check if the strict conditions described in the standard for testing analog-to-digital converters are met. Furthermore in special cases it is also possible to make corrections in the input to avoid mistakenly identified errors in the characteristic of the A/D converter.

Original languageEnglish
Title of host publication2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
Pages2662-2667
Number of pages6
DOIs
Publication statusPublished - 2012
Event2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012 - Graz, Austria
Duration: May 13 2012May 16 2012

Other

Other2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
CountryAustria
CityGraz
Period5/13/125/16/12

Fingerprint

Digital to analog conversion
Testing

Keywords

  • Analog-to-digital conversion
  • differential nonlinearity
  • histogram test
  • integral nonlinearity
  • sine fit

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Pálfi, V., & Kollár, I. (2012). Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings. In 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings (pp. 2662-2667). [6229502] https://doi.org/10.1109/I2MTC.2012.6229502

Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings. / Pálfi, Vilmos; Kollár, I.

2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings. 2012. p. 2662-2667 6229502.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pálfi, V & Kollár, I 2012, Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings. in 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings., 6229502, pp. 2662-2667, 2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012, Graz, Austria, 5/13/12. https://doi.org/10.1109/I2MTC.2012.6229502
Pálfi V, Kollár I. Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings. In 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings. 2012. p. 2662-2667. 6229502 https://doi.org/10.1109/I2MTC.2012.6229502
Pálfi, Vilmos ; Kollár, I. / Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings. 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings. 2012. pp. 2662-2667
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