Effect of Xe ion irration of Fe/Sn bilayers

S. Moncher, G. Principi, L. M. Gratton, C. Tosello, I. Czakó-Nagy, A. Vértes

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Abstract

Films of Fe (20 nm) and Sn (40 nm) have been deposited by PVD onto Al supports and irradiated with 100 keV Xe ions at a dose of 5×1015 ions/cm2. Scanning electron microscopy (SEM) shows that the irregular morphology of deposited Sn is considerably flattened by irradiation, which produces also a noticeable sputtering of Sn. Conversion electron Mössbauer spectroscopy (CEMS) reveals the formation at the interface of a variety of intermetallic phases which is enhanced by irradiation. These phases, seem to be insensible to prolonged (several months) room temperature aging. Their thermal stability under annealing at temperature up to 523 K has also been investigated.

Original languageEnglish
Pages (from-to)535-540
Number of pages6
JournalHyperfine Interactions
Volume46
Issue number1-4
DOIs
Publication statusPublished - Mar 1 1989

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Nuclear and High Energy Physics
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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  • Cite this

    Moncher, S., Principi, G., Gratton, L. M., Tosello, C., Czakó-Nagy, I., & Vértes, A. (1989). Effect of Xe ion irration of Fe/Sn bilayers. Hyperfine Interactions, 46(1-4), 535-540. https://doi.org/10.1007/BF02398240