Effect of relative L‐line intensity ratios on the accuracy of standardless x‐ray microanalysis

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Abstract

A standardless method for energy‐dispersive x‐ray microanalysis has been implemented. Pure element intensities were calculated from first principles. The spectrum processing and ZAF correction of the unknown spectra were effected by a modified FRAME‐C program. The replacement of the original constant relative L‐line intensities with Z‐dependent new values according to Schreiber and Wims improved the analytical accuracy of the program. The improvement is demonstrated by a better consistency of the measured and calculated L‐line intensities of pure elements and by the reduction of the RMS error from 15.2% to 8.5%, calculated on the basis of 64 analyses of compound standards measuring K and L line intensities.

Original languageEnglish
Pages (from-to)33-36
Number of pages4
JournalX-Ray Spectrometry
Volume16
Issue number1
DOIs
Publication statusPublished - 1987

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ASJC Scopus subject areas

  • Spectroscopy

Cite this

Effect of relative L‐line intensity ratios on the accuracy of standardless x‐ray microanalysis. / Lábár, J.

In: X-Ray Spectrometry, Vol. 16, No. 1, 1987, p. 33-36.

Research output: Contribution to journalArticle

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