EBIT diagnostics using X-ray spectra of highly ionized Ne

Marco Matranga, Marco Barbera, Antonio Maggio, Giovanni Peres, Salvatore Serio, E. Takács, Eric Silver, John Gillaspy, Herbert Schnopper, Martin Laming, Jeff Beeman, Eugen Haller, Norman Madden

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We have carried out a detailed analysis of highly ionized neon spectra collected at the NIST EBIT using an NTD germanium X-ray microcalorimeter developed at the Harvard-Smithsonian Center for Astrophysics [Nucl. Instr. and Meth. A 444 (2000) 156]. Our attention was focused especially on the Ne IX He-like triplet to check electron density diagnostics through the intercombination/forbidden line ratio. We have investigated possible effects of the ion dynamics on the plasma emission line intensities, looking at the dependence of the count-rate and the charge state distribution on the electron beam energy and current. The temperature and spatial distribution of the neon ions, and hence the overlap between the electron beam and the ion cloud, depend on the electron beam operating parameters. The overlap affects the average electron density seen by the ions, and in turn the measured line ratio. These results underscore the value of future improved studies of the trapped ion dynamics, both for understanding the EBIT performance and for allowing experimenters to take full advantage of its potential for astrophysical plasma diagnostics.

Original languageEnglish
Pages (from-to)244-249
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume205
DOIs
Publication statusPublished - May 2003

Fingerprint

Neon
Ions
Electron beams
X rays
Carrier concentration
electron beams
ions
x rays
neon
Trapped ions
Germanium
astrophysics
Plasma diagnostics
Astrophysics
plasma diagnostics
Spatial distribution
Temperature distribution
calorimeters
germanium
Plasmas

Keywords

  • EBIT
  • Excitation
  • Ionization of atoms
  • X-ray spectra

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

EBIT diagnostics using X-ray spectra of highly ionized Ne. / Matranga, Marco; Barbera, Marco; Maggio, Antonio; Peres, Giovanni; Serio, Salvatore; Takács, E.; Silver, Eric; Gillaspy, John; Schnopper, Herbert; Laming, Martin; Beeman, Jeff; Haller, Eugen; Madden, Norman.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 205, 05.2003, p. 244-249.

Research output: Contribution to journalArticle

Matranga, M, Barbera, M, Maggio, A, Peres, G, Serio, S, Takács, E, Silver, E, Gillaspy, J, Schnopper, H, Laming, M, Beeman, J, Haller, E & Madden, N 2003, 'EBIT diagnostics using X-ray spectra of highly ionized Ne', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 205, pp. 244-249. https://doi.org/10.1016/S0168-583X(03)00943-1
Matranga, Marco ; Barbera, Marco ; Maggio, Antonio ; Peres, Giovanni ; Serio, Salvatore ; Takács, E. ; Silver, Eric ; Gillaspy, John ; Schnopper, Herbert ; Laming, Martin ; Beeman, Jeff ; Haller, Eugen ; Madden, Norman. / EBIT diagnostics using X-ray spectra of highly ionized Ne. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003 ; Vol. 205. pp. 244-249.
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