Drift and noise of the carrier-envelope phase in a Ti: sapphire amplifier

A. Börzsönyi, R. S. Nagymihály, K. Osvay

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

We report on the drift and noise measurement of the carrier-envelope phase (CEP) of ultrashort pulses in a three-pass Ti:sapphire-based amplifier. Spectrally and spatially resolved interferometry makes it possible to investigate the absolute CEP changes due exclusively to the amplifier, that is, entirely separated from the incidental phase fluctuations of the oscillator. We found that propagation through the amplifier crystal could result in an increase up to 30 mrad noise depending on the repetition rate, cooling, and pumping conditions. Most of this noise is related to mechanical vibrations and thermal instabilities. The absolute CEP drift of thermal origin can be as large as 11 mrad/°C for each mm of the amplifier crystal, originating from inefficient heat conduction during the absorption of pump pulses. The noise of the thermal CEP drift is inversely proportional to the repetition rate, as was shown experimentally and proven by simulations.

Original languageEnglish
Article number015301
JournalLaser Physics Letters
Volume13
Issue number1
DOIs
Publication statusPublished - Jan 1 2016

Fingerprint

Sapphire
sapphire
envelopes
amplifiers
repetition
Crystals
Ultrashort pulses
Interferometry
Heat conduction
thermal instability
noise measurement
pulses
conductive heat transfer
Pumps
Cooling
crystals
interferometry
pumping
oscillators
pumps

Keywords

  • carrier-envelope phase
  • laser amplifier
  • spectral interferometry
  • thermal effect

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Drift and noise of the carrier-envelope phase in a Ti : sapphire amplifier. / Börzsönyi, A.; Nagymihály, R. S.; Osvay, K.

In: Laser Physics Letters, Vol. 13, No. 1, 015301, 01.01.2016.

Research output: Contribution to journalArticle

@article{1c3d016309dc41cfb096c218a7c4a7f7,
title = "Drift and noise of the carrier-envelope phase in a Ti: sapphire amplifier",
abstract = "We report on the drift and noise measurement of the carrier-envelope phase (CEP) of ultrashort pulses in a three-pass Ti:sapphire-based amplifier. Spectrally and spatially resolved interferometry makes it possible to investigate the absolute CEP changes due exclusively to the amplifier, that is, entirely separated from the incidental phase fluctuations of the oscillator. We found that propagation through the amplifier crystal could result in an increase up to 30 mrad noise depending on the repetition rate, cooling, and pumping conditions. Most of this noise is related to mechanical vibrations and thermal instabilities. The absolute CEP drift of thermal origin can be as large as 11 mrad/°C for each mm of the amplifier crystal, originating from inefficient heat conduction during the absorption of pump pulses. The noise of the thermal CEP drift is inversely proportional to the repetition rate, as was shown experimentally and proven by simulations.",
keywords = "carrier-envelope phase, laser amplifier, spectral interferometry, thermal effect",
author = "A. B{\"o}rzs{\"o}nyi and Nagymih{\'a}ly, {R. S.} and K. Osvay",
year = "2016",
month = "1",
day = "1",
doi = "10.1088/1612-2011/13/1/015301",
language = "English",
volume = "13",
journal = "Laser Physics Letters",
issn = "1612-2011",
publisher = "Wiley-VCH Verlag",
number = "1",

}

TY - JOUR

T1 - Drift and noise of the carrier-envelope phase in a Ti

T2 - sapphire amplifier

AU - Börzsönyi, A.

AU - Nagymihály, R. S.

AU - Osvay, K.

PY - 2016/1/1

Y1 - 2016/1/1

N2 - We report on the drift and noise measurement of the carrier-envelope phase (CEP) of ultrashort pulses in a three-pass Ti:sapphire-based amplifier. Spectrally and spatially resolved interferometry makes it possible to investigate the absolute CEP changes due exclusively to the amplifier, that is, entirely separated from the incidental phase fluctuations of the oscillator. We found that propagation through the amplifier crystal could result in an increase up to 30 mrad noise depending on the repetition rate, cooling, and pumping conditions. Most of this noise is related to mechanical vibrations and thermal instabilities. The absolute CEP drift of thermal origin can be as large as 11 mrad/°C for each mm of the amplifier crystal, originating from inefficient heat conduction during the absorption of pump pulses. The noise of the thermal CEP drift is inversely proportional to the repetition rate, as was shown experimentally and proven by simulations.

AB - We report on the drift and noise measurement of the carrier-envelope phase (CEP) of ultrashort pulses in a three-pass Ti:sapphire-based amplifier. Spectrally and spatially resolved interferometry makes it possible to investigate the absolute CEP changes due exclusively to the amplifier, that is, entirely separated from the incidental phase fluctuations of the oscillator. We found that propagation through the amplifier crystal could result in an increase up to 30 mrad noise depending on the repetition rate, cooling, and pumping conditions. Most of this noise is related to mechanical vibrations and thermal instabilities. The absolute CEP drift of thermal origin can be as large as 11 mrad/°C for each mm of the amplifier crystal, originating from inefficient heat conduction during the absorption of pump pulses. The noise of the thermal CEP drift is inversely proportional to the repetition rate, as was shown experimentally and proven by simulations.

KW - carrier-envelope phase

KW - laser amplifier

KW - spectral interferometry

KW - thermal effect

UR - http://www.scopus.com/inward/record.url?scp=84952801780&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84952801780&partnerID=8YFLogxK

U2 - 10.1088/1612-2011/13/1/015301

DO - 10.1088/1612-2011/13/1/015301

M3 - Article

AN - SCOPUS:84952801780

VL - 13

JO - Laser Physics Letters

JF - Laser Physics Letters

SN - 1612-2011

IS - 1

M1 - 015301

ER -