Double 1s shell ionization of Si induced in collisions with protons and heavy ions

M. Kavčič, M. Kobal, M. Budnar, J. Cl Dousse, K. Tökési

Research output: Contribution to journalConference article

3 Citations (Scopus)

Abstract

The double 1s ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the double to single K shell ionization cross-section ratios σKKK corresponding to the investigated collisions. The experimental ratios for collisions with heavy ions, where direct Coulomb ionization and electron capture need both to be considered, were compared to the theoretical values calculated within the independent electron approximation employing single electron ionization probabilities calculated by the three body classical trajectory Monte-Carlo (CTMC) method. For proton collisions where direct ionization solely contributes to 1s ionization the semiclassical approximation (SCA) was employed.

Original languageEnglish
Pages (from-to)235-239
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume233
Issue number1-4
DOIs
Publication statusPublished - May 1 2005
EventFast Ion-Atom Collisions Proceedings of the Eight Workshop on Fast Ion-Atom Collisions -
Duration: Sep 1 2004Sep 3 2004

Keywords

  • High-resolution X-ray spectroscopy
  • Ion atom collision
  • Multiple inner shell ionization

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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