Does beam divergence matter for neutron reflectometry?

Roger Pynn, Michael R. Fitzsimmons, Helmut Fritzsche, J. Major, M. Theo Rekveldt

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In this paper, we describe a method that uses Larmor precession of a neutron's spin to encode information about the direction of the neutron's path. We show that neutron spin echo (NSE) may be used to separate specular and diffuse reflection from the surface of a sample and to obtain information about the in-plane structure of thin films or interfaces. In the implementation discussed here, thin magnetic films of permalloy deposited on silicon substrates are used as Larmor precession devices that are both compact and well-defined geometrically and magnetically.

Original languageEnglish
Pages (from-to)1-7
Number of pages7
JournalPhysica B: Condensed Matter
Volume336
Issue number1-2
DOIs
Publication statusPublished - Aug 2003

Fingerprint

Larmor precession
divergence
Neutrons
neutrons
Magnetic thin films
specular reflection
magnetic films
Permalloys (trademark)
Silicon
echoes
Thin films
silicon
Substrates
thin films
Direction compound

Keywords

  • Neutron reflectometry
  • Neutron scattering
  • Neutron spin echo

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Does beam divergence matter for neutron reflectometry? / Pynn, Roger; Fitzsimmons, Michael R.; Fritzsche, Helmut; Major, J.; Rekveldt, M. Theo.

In: Physica B: Condensed Matter, Vol. 336, No. 1-2, 08.2003, p. 1-7.

Research output: Contribution to journalArticle

Pynn, R, Fitzsimmons, MR, Fritzsche, H, Major, J & Rekveldt, MT 2003, 'Does beam divergence matter for neutron reflectometry?', Physica B: Condensed Matter, vol. 336, no. 1-2, pp. 1-7. https://doi.org/10.1016/S0921-4526(03)00259-X
Pynn, Roger ; Fitzsimmons, Michael R. ; Fritzsche, Helmut ; Major, J. ; Rekveldt, M. Theo. / Does beam divergence matter for neutron reflectometry?. In: Physica B: Condensed Matter. 2003 ; Vol. 336, No. 1-2. pp. 1-7.
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