Dislocation structure and crystallite size in severely deformed copper by X-ray peak profile analysis

J. Gubicza, L. Balogh, R. J. Hellmig, Y. Estrin, T. Ungár

Research output: Contribution to journalArticle

83 Citations (Scopus)

Abstract

Copper specimens were severely deformed by equal channel angular pressing (ECAP) up to eight passes. The microstructure was studied by X-ray diffraction peak profile analysis as a function of strain (ε). It was found that the crystallite size is reduced to a few tens of nanometers already at ε = 0.7 and it does not change significantly during further deformation. At the same time, the dislocation density increases gradually up to ε = 4. The dipole character of the dislocation structure becomes stronger with increasing strain. The thermal stability of the microstructure is examined by differential scanning calorimetry (DSC). The temperature of the DSC peak related to the recovery of the microstructure decreases with increasing strain. At the beginning of the heat release, a bimodal grain structure develops indicated by a special double-peak shape of the diffraction line profiles.

Original languageEnglish
Pages (from-to)334-338
Number of pages5
JournalMaterials Science and Engineering A
Volume400-401
Issue number1-2 SUPPL.
DOIs
Publication statusPublished - Jul 25 2005

Keywords

  • Bimodal microstructure
  • Copper
  • Dislocation structure
  • Equal channel angular pressing
  • X-ray diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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