Development of powder diffraction apparatus for small-angle X-ray scattering measurements

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Abstract

A novel type of X-ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from <0.1 to 100 nm by combination of the small- and wide-angle X-ray scattering techniques. There is no dead interval in the detection between the small- and wide-angle regimes. This device can be attached to any existing 'θ/θ' powder diffractometer, providing a multi-functional small- and wide-angle X-ray scattering/diffraction (SWAXS) apparatus. After proper alignment and adjustment, the device can be removed and re-attached at any time to switch between normal and SWAXS functions.

Original languageEnglish
Pages (from-to)573-576
Number of pages4
JournalJournal of Applied Crystallography
Volume46
Issue number2
DOIs
Publication statusPublished - Apr 1 2013

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Keywords

  • X-ray collimation systems
  • instrumentation
  • powder diffraction
  • small- and wide-angle X-ray scattering (SWAXS)

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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