Development and evaluation of a microscopic method for determination of adhesion strength

Gy Tolnai, P. Nagy, Z. Keresztes, P. Lucz, E. Kálmán

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Measuring adhesion strength by macroscopic methods is a well-know procedure, but it lacks the sensitivity to the nano- and microscale spatial variations of morphological and chemical inhomogeneities. A microscopic method is developed for determining the local adhesion properties of nanostructured solid surfaces. Based on commercially available features of atomic force microscopes (AFM) an evaluation process has been established and its ability to determine the adhesion strength in nanoscale spatial variation has been demonstrated on model surfaces.

Original languageEnglish
Pages (from-to)279-286
Number of pages8
JournalMaterials Science Forum
Volume473-474
Publication statusPublished - 2005

Fingerprint

Bond strength (materials)
adhesion
evaluation
Microscopes
Adhesion
solid surfaces
microbalances
inhomogeneity
microscopes
sensitivity

Keywords

  • Adhesion
  • AFM
  • Interfacial energy
  • Nanostructured surface

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Development and evaluation of a microscopic method for determination of adhesion strength. / Tolnai, Gy; Nagy, P.; Keresztes, Z.; Lucz, P.; Kálmán, E.

In: Materials Science Forum, Vol. 473-474, 2005, p. 279-286.

Research output: Contribution to journalArticle

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