Picosecond transient thermoreflectance (PTTR) of metals is shown to depend strongly on the temperature coefficients of the complex dielectric constant. The properties of PTTR are studied for TE and TM waves as a function of the angle of incidence. A method is suggested for subtracting the thermal transport properties of thin films from PTTR measurements.
|Number of pages||7|
|Journal||Applied Physics B Photophysics and Laser Chemistry|
|Publication status||Published - Mar 1 1989|
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