Determination of thermal transport properties of thin metal films from pulsed thermoreflectance measurements in the picosecond regime

A. Miklós, A. Lörincz

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Picosecond transient thermoreflectance (PTTR) of metals is shown to depend strongly on the temperature coefficients of the complex dielectric constant. The properties of PTTR are studied for TE and TM waves as a function of the angle of incidence. A method is suggested for subtracting the thermal transport properties of thin films from PTTR measurements.

Original languageEnglish
Pages (from-to)261-267
Number of pages7
JournalApplied Physics B Photophysics and Laser Chemistry
Volume48
Issue number3
DOIs
Publication statusPublished - Mar 1 1989

Keywords

  • 65.00
  • 68.55-a
  • 78.20-e

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Determination of thermal transport properties of thin metal films from pulsed thermoreflectance measurements in the picosecond regime'. Together they form a unique fingerprint.

  • Cite this