Determination of thermal transport properties of thin metal films from pulsed thermoreflectance measurements in the picosecond regime

A. Miklós, A. Lőrincz

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Picosecond transient thermoreflectance (PTTR) of metals is shown to depend strongly on the temperature coefficients of the complex dielectric constant. The properties of PTTR are studied for TE and TM waves as a function of the angle of incidence. A method is suggested for subtracting the thermal transport properties of thin films from PTTR measurements.

Original languageEnglish
Pages (from-to)261-267
Number of pages7
JournalApplied Physics B Photophysics and Laser Chemistry
Volume48
Issue number3
DOIs
Publication statusPublished - Mar 1989

Fingerprint

metal films
Transport properties
incidence
transport properties
permittivity
coefficients
thin films
Metals
metals
temperature
Permittivity
Thin films
Hot Temperature
Temperature

Keywords

  • 65.00
  • 68.55-a
  • 78.20-e

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy (miscellaneous)
  • Engineering(all)

Cite this

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abstract = "Picosecond transient thermoreflectance (PTTR) of metals is shown to depend strongly on the temperature coefficients of the complex dielectric constant. The properties of PTTR are studied for TE and TM waves as a function of the angle of incidence. A method is suggested for subtracting the thermal transport properties of thin films from PTTR measurements.",
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