Determination of the surface excitation correction in elastic peak electron spectroscopy for selected conducting polymers

B. Lesiak, G. Gergely, J. Tóth, M. Menyhard, D. Varga, S. Gurban, A. Sulyok, A. Kosiński

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Inelastic mean free paths (IMFPs) determined by elastic peak electron spectroscopy (EPES) have been frequently evaluated neglecting surface excitations that affect the elastic peak intensity for a sample and a reference material. The surface excitation correction is defined by the surface excitation parameter, Ps, denoted by SEP. SEPs for eight selected conducting polymers (polythiophenes, polyaniline and polyethylene) undoped and doped with Pd were determined by EPES using Ag, Ni and Si reference materials for electron energies between 0.2 and 2.0 keV. The mean percentage deviations between IMFPs uncorrected for surface excitations and those calculated with the predictive formulae of Gries and Tanuma et al. were 4.32 and 27.32%, respectively. Relevant deviations for IMFPs corrected for surface excitations were 2.97 and 22.90%, respectively.

Original languageEnglish
Pages (from-to)14-17
Number of pages4
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume154
Issue number1-2
DOIs
Publication statusPublished - Dec 1 2006

Keywords

  • EPES
  • Elastic peak
  • Elastic peak electron spectroscopy
  • IMFP
  • Inelastic mean free path
  • Polymers
  • Surface excitations

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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