Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene

András Pálinkás, G. Molnár, Chanyong Hwang, L. Bíró, Z. Osváth

Research output: Contribution to journalArticle

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Abstract

Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4-5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20-35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.

Original languageEnglish
Pages (from-to)86253-86258
Number of pages6
JournalRSC Advances
Volume6
Issue number89
DOIs
Publication statusPublished - 2016

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Scanning tunneling microscopy
Graphene
Atomic force microscopy
Bias voltage
Imaging techniques
Gold
Nanoindentation
Chemical vapor deposition

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)

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Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene. / Pálinkás, András; Molnár, G.; Hwang, Chanyong; Bíró, L.; Osváth, Z.

In: RSC Advances, Vol. 6, No. 89, 2016, p. 86253-86258.

Research output: Contribution to journalArticle

@article{39abbaa12bb84105b9bfddc135730133,
title = "Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene",
abstract = "Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4-5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20-35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.",
author = "Andr{\'a}s P{\'a}link{\'a}s and G. Moln{\'a}r and Chanyong Hwang and L. B{\'i}r{\'o} and Z. Osv{\'a}th",
year = "2016",
doi = "10.1039/c6ra19660h",
language = "English",
volume = "6",
pages = "86253--86258",
journal = "RSC Advances",
issn = "2046-2069",
publisher = "Royal Society of Chemistry",
number = "89",

}

TY - JOUR

T1 - Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene

AU - Pálinkás, András

AU - Molnár, G.

AU - Hwang, Chanyong

AU - Bíró, L.

AU - Osváth, Z.

PY - 2016

Y1 - 2016

N2 - Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4-5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20-35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.

AB - Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions determined by the size and shape of nanoislands. These graphene bubbles can be squeezed during STM imaging using bias voltages of less than 250 mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over gold nanovoids is deflected 4-5 nm by the STM tip when imaging at low bias voltages (U = 30 mV). Nanoindentation measurements performed by AFM show that the squeezing of graphene bubbles occurs at repulsive forces of 20-35 nN, and such forces can result in deflections of several nanometres in suspended graphene parts, respectively. Comparing the AFM and STM results, this study reveals that mechanical forces of the order of 10-8 N occur between the STM tip and graphene under ambient imaging conditions and typical tunnelling parameters.

UR - http://www.scopus.com/inward/record.url?scp=84987864022&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84987864022&partnerID=8YFLogxK

U2 - 10.1039/c6ra19660h

DO - 10.1039/c6ra19660h

M3 - Article

AN - SCOPUS:84987864022

VL - 6

SP - 86253

EP - 86258

JO - RSC Advances

JF - RSC Advances

SN - 2046-2069

IS - 89

ER -